X-ray data processing

X-ray data processing

The method of molecular structure determination by X-ray crystallography is a little over a century old. The history is described briefly, along with developments in X-ray sources and detectors. The fundamental processes involved in measuring diffraction patterns on area detectors, i.e. autoindexing, refining crystal and detector parameters, integrating the reflections themselves and putting th...

X-Ray Data Booklet Section 4.5 X-RAY DETECTORS

A wide variety of x-ray detectors is available, some counting single photons, some providing only measurements of count rate or total flux, others measuring the energy, position, and/or incidence time of each x-ray. Table 4-2 provides typical values for useful energy range, energy resolution, dead time per event, and maximum count rate capability for common x-ray detectors. For special applicat...

Data processing software suite SITENNO for coherent X-ray diffraction imaging using the X-ray free-electron laser SACLA

Coherent X-ray diffraction imaging is a promising technique for visualizing the structures of non-crystalline particles with dimensions of micrometers to sub-micrometers. Recently, X-ray free-electron laser sources have enabled efficient experiments in the `diffraction before destruction' scheme. Diffraction experiments have been conducted at SPring-8 Angstrom Compact free-electron LAser (SACLA...

X-ray Diffraction Data Collection

“point” and “area” (originally film) detectors. The first X-ray diffraction experiment by Friedrich and Knipping [1] used film, but within the same year Bragg was using an ionization chamber mounted on a rotating arm [2]. The advantage of Bragg's X-ray detector was that it defined precisely the angle of the diffracted rays and, in general, gave more accurate intensity measurements. The advantag...

Application of the X-ray measurement model to image processing of X-ray radiographs